The article is to study the development of computer-aided design of X-ray microtomographyââ?¬â?the device for investigating\r\nthe structure and construction of three-dimensional images of organic and inorganic objects on the basis of shadow\r\nprojections. This article provides basic information regarding CAD of X-ray microtomography and a scheme consisting\r\nof three levels. The article also shows basic relations of X-ray computed tomography, the generalized scheme of an Xray\r\nmicrotomographic scanner. The methods of X-ray imaging of the spatial microstructure and morphometry of\r\nmaterials are described. The main characteristics of an X-ray microtomographic scanner, the X-ray source, X-ray optical\r\nelements and mechanical components of the positioning system are shown. The block scheme and software functional\r\nscheme for intelligent neural network system of analysis of the internal microstructure of objects are presented.\r\nThe method of choice of design parameters of CAD of X-ray microtomography aims at improving the quality of design\r\nand reducing costs of it. It is supposed to reduce the design time and eliminate the growing number of engineers\r\ninvolved in development and construction of X-ray microtomographic scanners.
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